This measurement is nearly identical to the “E-Phi Radiation Pattern (Sweep Frequency): SF_EPhi” measurement; see that measurement for details. The difference is that SF_EPhi_CKT setup now references a subcircuit in a schematic rather than a stand-alone EM structure. This measurement allows you to view an antenna pattern accounting for the other circuit parameters connected to the EM simulation result.
NOTE: The Cadence® AWR® AXIEM® 3D planar EM analysis simulator and Cadence® AWR® Analyst™ 3D FEM EM analysis software simulator are supported for this annotation. For restrictions when using in-situ measurements, see “In-situ Measurements and Annotations”.
|EM Structure Name||Subcircuit||1 to 1000 ports|
|Id||SUBCKT or EXTRACT Id||N/A|
|Include Resistive Losses ||Check box||N/A|
|Include Reflection/Coupling Losses||Check box||N/A|
|Theta (degrees)||Real||0 to 90 if there is an infinite ground plane below the antenna, or 90 to 180 if there is an infinite ground plane above the antenna, or 0 to 180 if there is not an infinite ground plane.|
|Phi (degrees)||Real||-180 to 180|
|Use Interpolated Data||Check box||N/A|
|Sweep Freq||Frequency||See |
 NOTE: Some solvers do not support the calculation of resistive loss. If the selected solver does not support this option an error message displays if you select it. (EMSight does not support this, AXIEM does.)
NOTE: All measurements will have additional parameters that allow you to specify the plotting configuration for swept parameters. These parameters are dynamic; they change based upon which data source is selected. See “Swept Parameter Analysis ” for details on configuring these parameters.
See “E-Phi Radiation Pattern (Sweep Frequency): SF_EPhi” for details.