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Circuit Driving Axial Ratio Radiation Pattern (Sweep Frequency): SF_AR_CKT

Summary

This measurement is nearly identical to the “Axial Ratio Radiation Pattern (Sweep Frequency): SF_AR” measurement; see that measurement for details. The difference is that SF_AR_CKT setup now references a subcircuit in a schematic rather than a stand-alone EM structure. This measurement allows you to view an antenna pattern accounting for the other circuit parameters connected to the EM simulation result.

NOTE: The Cadence® AWR® AXIEM® 3D planar EM analysis simulator and Cadence® AWR® Analyst™ 3D FEM EM analysis software simulator are supported for this annotation. For restrictions when using in-situ measurements, see “In-situ Measurements and Annotations”.

Parameters

Name Type Range
EM Structure Name Subcircuit  
Excitation circuit Subcircuit N/A
Id SUBCKT or EXTRACT Id N/A
Theta (degrees) Real 0 to 90 if there is an infinite ground plane below the antenna, or 90 to 180 if there is an infinite ground plane above the antenna, or 0 to 180 if there is not an infinite ground plane.
Phi (degrees) Real -180 to 180
Use Interpolated Data Check box N/A
Sweep Freq Frequency See [1]

[1] These parameters are dynamic; they change based upon which data source is selected. See “Swept Parameter Analysis ” for details on configuring these parameters.

NOTE: All measurements will have additional parameters that allow you to specify the plotting configuration for swept parameters. These parameters are dynamic; they change based upon which data source is selected. See “Swept Parameter Analysis ” for details on configuring these parameters.

Result

See “Axial Ratio Radiation Pattern (Sweep Frequency): SF_AR” for details.

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