This measurement is nearly identical to the “Axial Ratio Radiation Pattern (Sweep Frequency): SF_AR” measurement; see that measurement for details. The difference is that SF_AR_CKT setup now references a subcircuit in a schematic rather than a stand-alone EM structure. This measurement allows you to view an antenna pattern accounting for the other circuit parameters connected to the EM simulation result.
NOTE: The Cadence® AWR® AXIEM® 3D planar EM analysis simulator and Cadence® AWR® Analyst™ 3D FEM EM analysis software simulator are supported for this annotation. For restrictions when using in-situ measurements, see “In-situ Measurements and Annotations”.
|EM Structure Name||Subcircuit|
|Id||SUBCKT or EXTRACT Id||N/A|
|Theta (degrees)||Real||0 to 90 if there is an infinite ground plane below the antenna, or 90 to 180 if there is an infinite ground plane above the antenna, or 0 to 180 if there is not an infinite ground plane.|
|Phi (degrees)||Real||-180 to 180|
|Use Interpolated Data||Check box||N/A|
|Sweep Freq||Frequency||See |
NOTE: All measurements will have additional parameters that allow you to specify the plotting configuration for swept parameters. These parameters are dynamic; they change based upon which data source is selected. See “Swept Parameter Analysis ” for details on configuring these parameters.
See “Axial Ratio Radiation Pattern (Sweep Frequency): SF_AR” for details.